Zygo 1776-666-010 Step Height Standard, 1.75 um nominal certified height
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Description
The Zygo 1776-666-010 Step Height Standard is a precision calibration artifact used for verifying the accuracy and performance of optical metrology instruments, such as interferometers and surface profilers, in measuring step heights and surface features. Here are the key specifications of the Zygo 1776-666-010 Step Height Standard:
- Certified Height: The standard has a nominal certified height of 1.75 micrometers (µm), which is the known and verified height used for calibration purposes.
- Precision Machined: Manufactured with high precision using advanced machining techniques to ensure the accuracy and repeatability of the step height measurement.
- Material Composition: Typically made from materials with low thermal expansion coefficients and high stability, ensuring minimal dimensional changes due to temperature variations.
- Surface Finish: Features a highly polished and flat surface finish to minimize measurement errors and ensure optimal performance during calibration.
- Traceability: The standard is accompanied by a certificate of calibration or traceability, providing documented evidence of its accuracy and conformity to established measurement standards.
- Usage: Used as a reference standard for calibrating optical metrology instruments, verifying the accuracy of step height measurements, and assessing the performance of surface profiling systems.
- Compatibility: Designed to be compatible with a wide range of optical metrology systems from various manufacturers, making it a versatile calibration tool for the industry.
- Calibration Interval: Typically recommended to undergo periodic recalibration or verification to maintain its accuracy and traceability over time.
- Applications: Widely used in industries such as semiconductor manufacturing, precision engineering, optics, and research laboratories where precise step height measurements and calibration of metrology instruments are essential for quality control and process optimization.
In summary, the Zygo 1776-666-010 Step Height Standard is a precision-calibrated artifact with a certified height of 1.75 µm, used for calibrating optical metrology instruments and verifying the accuracy of step height measurements in various industrial and scientific applications.
Laboratory Calibration
Micro Precision operates 36 laboratories globally providing reliable localized support
- Certified metrologists staffing laboratories in North America, Central America, South America, Europe, Asia, and the Middle East
- Comprehensive scopes of accreditation to meet a broad range of customer needs
- Expedited calibration services available
- Pickup and delivery services available
- Environmentally controlled facilities to ensure high quality and accurate calibrations and measurements.
Laboratory Calibration
Micro Precision operates 36 laboratories globally providing reliable localized support
- Certified metrologists staffing laboratories in North America, Central America, South America, Europe, Asia, and the Middle East
- Comprehensive scopes of accreditation to meet a broad range of customer needs
- Expedited calibration services available
- Pickup and delivery services available
- Environmentally controlled facilities to ensure high quality and accurate calibrations and measurements.
Quality Certified Test Equipment Repair Services
When a piece of equipment fails you have the option to repair or replace that item. Oftentimes repair is an economical and efficient solution. Micro Precision’s repair offering provides advantages to our customers:
- Cost effective; often less than OEM
- Efficient; often much better turn-time than the OEM
- Flexibility; willingness to work with customers to meet their needs
- Warranted repairs
- Ability to service many obsolete instruments
Quality Certified Test Equipment Repair Services
When a piece of equipment fails you have the option to repair or replace that item. Oftentimes repair is an economical and efficient solution. Micro Precision’s repair offering provides advantages to our customers:
- Cost effective; often less than OEM
- Efficient; often much better turn-time than the OEM
- Flexibility; willingness to work with customers to meet their needs
- Warranted repairs
- Ability to service many obsolete instruments
Cost Effective Test Equipment Options
From the leasing of specialized electronic equipment for a specific task, to the purchase of physical and dimensional tools, we offer leasing services as well as used test equipment sales. We also locate hard-to-find electronics, and provide flexible options to meet ever-changing equipment needs.
Cost Effective Test Equipment Options
From the leasing of specialized electronic equipment for a specific task, to the purchase of physical and dimensional tools, we offer leasing services as well as used test equipment sales. We also locate hard-to-find electronics, and provide flexible options to meet ever-changing equipment needs.
Our Capabilities
Micro Precision can perform instrument calibration services on equipment from variety of applications for specific industries and lines of business. If you have a calibration need that is not listed in this area, please contact us.
Electrical
Micro Precision accredited electrical calibration lab services with multimeter, multifunction calibrator, oscilloscope, and power supply capabilities.
Optical
Micro Precision accredited optical, light, and fiber optic calibration lab services.
Thermodynamics & Chemical
Micro Precision accredited thermodynamic & chemical calibration lab services with temperature, humidity, life science, and pharma capabilities.
RF - Microwave
Micro Precision accredited RF & microwave calibration lab services.
Mechanical & Dimensional
Micro Precision accredited mechanical and dimensional calibration lab services with pressure, torque, force, flow, velocity, and aircraft jack load capabilities.
Laboratory Standards
Calibration laboratory standards are critical for your organization’s most accurate measurements.
Semiconductor Calibration
Micro Precision utilizes state-of-the-art technology to analyze semiconductor wafer thickness and step height.