Zeiss SURFCOM 130 Surface Roughness Measuring – Zeiss Surfcom

Beschrijving

The Zeiss SURFCOM 130 Surface Roughness Measuring instrument, also known as Zeiss Surfcom, is a high-precision surface roughness measurement device designed for industrial applications where accurate surface quality assessment is essential. Here are the key specifications of the Zeiss SURFCOM 130:

• Measurement Parameters: The Zeiss SURFCOM 130 measures surface roughness parameters such as Ra (average roughness), Rz (mean roughness depth), Rq (root mean square roughness), Rt (maximum peak-to-valley height), Rmax (maximum roughness depth), and others based on ISO and ANSI standards.
• Measurement Range: It offers a wide measurement range suitable for various surface textures and profiles, typically ranging from a few nanometers to tens of micrometers, ensuring versatility in measuring different workpiece surfaces.
• Probe System: Equipped with a highly sensitive stylus probe or non-contact probe, the instrument can accurately trace surface contours and detect fine irregularities, providing precise surface roughness measurements.
• Evaluation Length: The Zeiss SURFCOM 130 allows users to set the evaluation length or cutoff length, which determines the sampling length for calculating roughness parameters, ensuring flexibility in assessing surface texture characteristics.
• Measurement Modes: It supports different measurement modes such as vertical scanning mode, horizontal scanning mode, and combination modes, allowing users to choose the appropriate mode for specific surface measurement requirements.
• Analysis Software: The instrument is accompanied by dedicated analysis software that offers advanced data processing, graphical representation of surface profiles, statistical analysis of roughness parameters, and customizable reporting features for comprehensive surface quality analysis.
• Accuracy and Repeatability: The Zeiss SURFCOM 130 provides high measurement accuracy and repeatability, enabling reliable and consistent surface roughness measurements critical for quality control and manufacturing processes.
• User Interface: Features an intuitive user interface with a touchscreen display or control panel, easy-to-navigate menus, measurement presets, and real-time measurement feedback, ensuring user-friendly operation and efficient data acquisition.
• Data Storage: The instrument allows for data storage and recall of measurement results, setups, and calibration data, facilitating traceability, documentation, and comparison of surface roughness data over time.
• Calibration and Maintenance: Regular calibration, maintenance, and verification are recommended to maintain measurement accuracy and performance, with calibration procedures and service guidelines provided by Zeiss for optimal functionality.
• Application: The Zeiss SURFCOM 130 is suitable for a wide range of industries and applications, including automotive, aerospace, medical devices, precision engineering, metalworking, semiconductor manufacturing, and surface coating industries, where precise surface finish evaluation is crucial for product quality and performance assessment.

In summary, the Zeiss SURFCOM 130 Surface Roughness Measuring instrument offers advanced surface roughness measurement capabilities, accuracy, versatility, and user-friendly operation, making it an essential tool for quality assurance, research, and development in various manufacturing and engineering fields.