Agilent E5270A VXI

Beschrijving

Developed for semiconductor device characterization, the Agilent E5270A VXI is a highly developed and adaptable test system. For engineers and researchers conducting testing on semiconductor devices, it is the perfect option because it provides full measurement capabilities. The E5270A makes a variety of measurement modules, including as DC and RF sources, voltage and current analyzers, and pulse generators, simple to integrate thanks to its modular VXI platform. Due to this, users are able to carry out a variety of tests, including pulsed I-V measurements, capacitance-voltage (C-V) measurements, and current-voltage (I-V) characterization. For effective data analysis and automation, the E5270A also features a user-friendly interface and strong software. The Agilent E5270A VXI is a dependable and effective test system that enables users to precisely and quickly characterize semiconductor devices.

 Specifications

– Supports up to 4 slots
– Supports up to 4 DC source/monitor units per slot
– Measurement resolution: 1 µV, 1 pA
– Measurement accuracy: ±0.015% of reading + 0.007% of range
– Voltage source range: ±100 V
– Current source range: ±1 A
– Voltage measurement range: ±100 V
– Current measurement range: ±1 A
– Built-in constant voltage, constant current, and constant resistance modes
– Sweep capability for voltage, current, and resistance measurements
– Programmable voltage and current limits for protection
– 24-bit digital I/O interface
– GPIB, RS-232, and VXIbus interfaces for remote control and data transfer
– Compatible with Agilent VEE Pro, Agilent 4294A, and Agilent 4284A software
– Supports SCPI command set for programming flexibility
– Built-in self-test and calibration functions
– Dimensions: 133 mm (H) x 213 mm (W) x 400 mm (D)
– Weight: 7.5 kg

Agilent E5270A is also available with the following specs and model:

• Parametric Measurement Mainframe – 8 Slot