Non-Contact 3D Optical Metrology
The Zygo NewView 200 is an optical instrument that creates high-resolution, three-dimensional maps of surfaces without touching them. It uses light to measure surface features down to the nanometer scale. This is essential for companies that need to ensure precision and quality in their products.
This device is not a simple microscope or profilometer. It combines the strengths of both to give you detailed images and exact measurements. Its main purpose is to measure surface topography when the shape of a surface directly affects how a product performs and lasts. This applies to a wide range of fields, from microelectronics to precision parts.
What It Does
Mapping Roughness
Answers the fundamental question "How smooth is this part, really?" It is critical from ensuring an optical lens won't scatter light to verify that a bearing surface will have a long service life.
Checking Step Heights
In microelectronics and MEMS (Micro-Electro-Mechanical Systems), the height of a layer on a microchip can be as important as its width. This device can accurately measure these tiny vertical steps.
Inspecting Flatness
This instrument can map the flatness of a part's surface with incredible accuracy so that components fit together perfectly and function as designed.
Material and Surface
Condition Compatibility
Optical Properties
Opaque, Transparent, Translucent, Coated, Uncoated, Specular, Any Color
Surface Texture
Rough, Super-smooth, Discontinuous
Geometric Form
Flat, Curved, Sloped
General
Virtually Any Material
Expert Calibration for the Zygo NewView 200
Your Zygo NewView 200 is a cornerstone of your quality and research, providing critical data through non-contact surface metrology. Like any precision optical profiler, its performance relies on periodic, expert calibration to counteract measurement drift. Our process goes beyond a simple check; we meticulously verify stage accuracy and optical system alignment and ensure vertical scanning measurements (z-axis) are traceable to recognized standards. This guarantees your instrument's data is not just repeatable but truly accurate.
Don’t let measurement uncertainty creep into your work. Let’s ensure your NewView 200 performs as precisely as the day it was installed.
Coherence Scanning Interferometry (CSI)
The NewView 200 operates on Coherence Scanning Interferometry (CSI), a non-contact optical method for 3D surface profiling. This process precisely measures surface topography at the nanometer scale. Here's how it works:
Light Splitting
A white light beam is split; one part reflects off a reference mirror, the other off the sample surface.
Interference
The two reflected beams recombine, creating interference patterns that reveal surface height differences.
Scanning
The system moves vertically, capturing interference data at various depths to construct a comprehensive 3D surface profile.
Sub-nm Resolution
Detects atomic-scale features, enabling precise measurements like 0.1 nm roughness.
Vibration Resistance
SureScan™ technology minimizes measurement noise from environmental vibrations.
Transparent Films
Capable of measuring layers beneath surfaces, such as those found in OLED displays.
Measurement Capabilities
The NewView 200 operates on Coherence Scanning Interferometry (CSI), a non-contact optical method for 3D surface profiling. This process precisely measures surface topography at the nanometer scale. Here's how it works:
| Parameter | Range | Example Use Case |
|---|---|---|
| Roughness (Sa) | 0.1 nm – 100 µm | Polished optics (Ra < 1 nm) |
| Step Height | 1 nm – 20 µm | MEMS device trenches |
| Flatness (PV) | λ/10 (≈63 nm) | Telescope mirror calibration |
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Service Area
If you have any inquiries, recommendations, or simply wish to connect with us, we’d love to hear from you! Please don’t hesitate to reach out to us at
22835 Industrial Place Grass Valley CA 95949
or you can contact us via phone at
(530) 268-1860
or email us at [email protected]
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